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Resilience in all-optical label switching networks: a node dimensioning point of view

dc.contributor.authorVan Caenegem, Ruth
dc.contributor.authorColle, Didier
dc.contributor.authorPickavet, Mario
dc.contributor.authorDemeester, Piet
dc.date.accessioned2021-10-16T05:54:18Z
dc.date.available2021-10-16T05:54:18Z
dc.date.issued2005-11
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/11351
dc.sourceIIOimport
dc.titleResilience in all-optical label switching networks: a node dimensioning point of view
dc.typeMeeting abstract
dc.contributor.imecauthorColle, Didier
dc.contributor.imecauthorPickavet, Mario
dc.contributor.imecauthorDemeester, Piet
dc.contributor.orcidimecColle, Didier::0000-0002-1428-0301
dc.contributor.orcidimecPickavet, Mario::0000-0001-5817-7886
dc.contributor.orcidimecDemeester, Piet::0000-0003-2810-3899
dc.source.peerreviewno
dc.source.beginpage191
dc.source.conferenceAsia-Pacific Optical Communications Conference - APOC
dc.source.conferencedate6/11/2005
dc.source.conferencelocationShangai China
imec.availabilityPublished - imec
imec.internalnotesCD-ROM proceedings


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