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Transmission electron microscopy characterisation of Ti and Al/Ti contacts on GaN and AlGaN/GaN

dc.contributor.authorVan Daele, B.
dc.contributor.authorVan Tendeloo, G.
dc.contributor.authorRuythooren, Wouter
dc.contributor.authorDerluyn, Joff
dc.contributor.authorLeys, Maarten
dc.contributor.authorGermain, Marianne
dc.date.accessioned2021-10-16T05:56:43Z
dc.date.available2021-10-16T05:56:43Z
dc.date.issued2005
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/11358
dc.sourceIIOimport
dc.titleTransmission electron microscopy characterisation of Ti and Al/Ti contacts on GaN and AlGaN/GaN
dc.typeProceedings paper
dc.contributor.imecauthorRuythooren, Wouter
dc.source.peerreviewno
dc.source.beginpage389
dc.source.endpage392
dc.source.conferenceMicroscopy of Semiconducting Materials. Proceedings of the 14th Conference
dc.source.conferencedate11/04/2005
dc.source.conferencelocationOxford UK
imec.availabilityPublished - imec
imec.internalnotesSpringer Proceedings in Physics; Vol. 107


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