Authors

Van Daele, B.; Van Tendeloo, G.; Ruythooren, Wouter; Derluyn, Joff; Leys, Maarten; Germain, Marianne

Conference

Microscopy of Semiconducting Materials. Proceedings of the 14th Conference

Title

Transmission electron microscopy characterisation of Ti and Al/Ti contacts on GaN and AlGaN/GaN

Publication type

Proceedings paper