Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Conference contributions
Transmission electron microscopy characterisation of Ti and Al/Ti contacts on GaN and AlGaN/GaN
Publication:
Transmission electron microscopy characterisation of Ti and Al/Ti contacts on GaN and AlGaN/GaN
Copy permalink
Date
2005
Proceedings Paper
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Van Daele, B.
;
Van Tendeloo, G.
;
Ruythooren, Wouter
;
Derluyn, Joff
;
Leys, Maarten
;
Germain, Marianne
Journal
Abstract
Description
Metrics
Views
1900
since deposited on 2021-10-16
2
last month
Acq. date: 2025-12-11
Citations
Metrics
Views
1900
since deposited on 2021-10-16
2
last month
Acq. date: 2025-12-11
Citations