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Transmission electron microscopy characterisation of Ti and Al/Ti contacts on GaN and AlGaN/GaN
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Transmission electron microscopy characterisation of Ti and Al/Ti contacts on GaN and AlGaN/GaN
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Date
2005
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Van Daele, B.
;
Van Tendeloo, G.
;
Ruythooren, Wouter
;
Derluyn, Joff
;
Leys, Maarten
;
Germain, Marianne
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1903
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Acq. date: 2026-01-25
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Views
1903
since deposited on 2021-10-16
2
last month
1
last week
Acq. date: 2026-01-25
Citations