Publication:
Transmission electron microscopy characterisation of Ti and Al/Ti contacts on GaN and AlGaN/GaN
Date
| dc.contributor.author | Van Daele, B. | |
| dc.contributor.author | Van Tendeloo, G. | |
| dc.contributor.author | Ruythooren, Wouter | |
| dc.contributor.author | Derluyn, Joff | |
| dc.contributor.author | Leys, Maarten | |
| dc.contributor.author | Germain, Marianne | |
| dc.contributor.imecauthor | Ruythooren, Wouter | |
| dc.date.accessioned | 2021-10-16T05:56:43Z | |
| dc.date.available | 2021-10-16T05:56:43Z | |
| dc.date.issued | 2005 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/11358 | |
| dc.source.beginpage | 389 | |
| dc.source.conference | Microscopy of Semiconducting Materials. Proceedings of the 14th Conference | |
| dc.source.conferencedate | 11/04/2005 | |
| dc.source.conferencelocation | Oxford UK | |
| dc.source.endpage | 392 | |
| dc.title | Transmission electron microscopy characterisation of Ti and Al/Ti contacts on GaN and AlGaN/GaN | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
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