Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Conference contributions
Dopant/carrier profiling for sub-45nm technologies
Publication:
Dopant/carrier profiling for sub-45nm technologies
Date
2005
Meeting abstract
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Vandervorst, Wilfried
;
Janssens, Tom
;
Eyben, Pierre
;
Duriau, Edouard
Journal
Abstract
Description
Metrics
Views
1931
since deposited on 2021-10-16
446
item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations
Metrics
Views
1931
since deposited on 2021-10-16
446
item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations