Authors

De Blauwe, Jan; Degraeve, Robin; Bellens, Rudi; Van Houdt, Jan; Groeseneken, Guido; Maes, Herman

Conference

27th IEEE Semiconductor Interface Specialists Conference (SISC); December 5-7, 1996; San Diego, Calif., USA.

Title

Degradation and nitridation dependence of steady-state stress induced leakage current (SILC)

Publication type

Oral presentation