dc.contributor.author | Verheyen, Peter | |
dc.contributor.author | Eneman, Geert | |
dc.contributor.author | Rooyackers, Rita | |
dc.contributor.author | Loo, Roger | |
dc.contributor.author | Eeckhout, Lieve | |
dc.contributor.author | Rondas, Dirk | |
dc.contributor.author | Leys, Frederik | |
dc.contributor.author | Snow, Jim | |
dc.contributor.author | Shamiryan, Denis | |
dc.contributor.author | Demand, Marc | |
dc.contributor.author | Hoffmann, Thomas Y. | |
dc.contributor.author | Goodwin, Michael | |
dc.contributor.author | Fujimoto, Hiromasa | |
dc.contributor.author | Ravit, Claire | |
dc.contributor.author | Lee, Byeong Chan | |
dc.contributor.author | Caymax, Matty | |
dc.contributor.author | De Meyer, Kristin | |
dc.contributor.author | Absil, Philippe | |
dc.contributor.author | Jurczak, Gosia | |
dc.contributor.author | Biesemans, Serge | |
dc.date.accessioned | 2021-10-16T06:50:33Z | |
dc.date.available | 2021-10-16T06:50:33Z | |
dc.date.issued | 2005-12 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/11509 | |
dc.source | IIOimport | |
dc.title | Demonstration of recessed SiGe S/D and inserted metal gate on HfO2 for high performance pFETs | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Verheyen, Peter | |
dc.contributor.imecauthor | Eneman, Geert | |
dc.contributor.imecauthor | Loo, Roger | |
dc.contributor.imecauthor | Rondas, Dirk | |
dc.contributor.imecauthor | Demand, Marc | |
dc.contributor.imecauthor | Caymax, Matty | |
dc.contributor.imecauthor | De Meyer, Kristin | |
dc.contributor.imecauthor | Absil, Philippe | |
dc.contributor.imecauthor | Jurczak, Gosia | |
dc.contributor.imecauthor | Biesemans, Serge | |
dc.contributor.orcidimec | Eneman, Geert::0000-0002-5849-3384 | |
dc.contributor.orcidimec | Loo, Roger::0000-0003-3513-6058 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 907 | |
dc.source.endpage | 910 | |
dc.source.conference | Technical Digest International Electron Devices Meeting (IEDM) | |
dc.source.conferencedate | 5/12/2005 | |
dc.source.conferencelocation | Washington, D.C. USA | |
imec.availability | Published - imec | |