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Effects of voltage cycling on polarization and reliability of 3D SBT ferroelectric capacitors integrated in 0.18um CMOS technology
Publication:
Effects of voltage cycling on polarization and reliability of 3D SBT ferroelectric capacitors integrated in 0.18um CMOS technology
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Date
2005
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Wouters, Dirk
;
Goux, Ludovic
;
Lisoni, Judit
;
Maes, David
;
Vander Meeren, Hans
;
Paraschiv, Vasile
;
Haspeslagh, Luc
;
Artoni, Cesari
;
Corallo, Giuseppina
;
Zambrano, Raffaele
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1895
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Acq. date: 2025-12-10
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Metrics
Views
1895
since deposited on 2021-10-16
2
last month
1
last week
Acq. date: 2025-12-10
Citations