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Conference contributions
Simple analytical model to study the STC bias point in FinFETs
Publication:
Simple analytical model to study the STC bias point in FinFETs
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Date
2007
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Bellodi, M.
;
Camillo, L.M.
;
Martino, J.A.
;
Simoen, Eddy
;
Claeys, Cor
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1832
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Acq. date: 2025-12-12
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Metrics
Views
1832
since deposited on 2021-10-16
1
last month
Acq. date: 2025-12-12
Citations