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Dual beam FIB/SEM cross-section imaging of nano-structures
Publication:
Dual beam FIB/SEM cross-section imaging of nano-structures
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Date
2007
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Bender, Hugo
;
Drijbooms, Chris
;
Van Marcke, Patricia
;
Geypen, Jef
;
Marrant, Koen
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1993
since deposited on 2021-10-16
1
last month
Acq. date: 2025-12-11
Citations
Metrics
Views
1993
since deposited on 2021-10-16
1
last month
Acq. date: 2025-12-11
Citations