Measurement and modeling of the sensitivity of LC-VCO's to substrate noise perturbations

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Authors
Bronckers, Stephane; Vandersteen, Gerd; Soens, Charlotte; Van der Plas, Geert; Rolain, Yves
Conference
Proceedings IEEE Instrumentation and Measurement Technology Conference - IMTC
Title
Measurement and modeling of the sensitivity of LC-VCO's to substrate noise perturbations
Publication type
Proceedings paper
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