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Articles
Soft breakdown of ultra-thin gate oxide layers
Publication:
Soft breakdown of ultra-thin gate oxide layers
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Date
1996
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Depas, Michel
;
Nigam, Tanya
;
Heyns, Marc
Journal
IEEE Transactions on Electron Devices
Abstract
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1844
since deposited on 2021-09-29
Acq. date: 2025-12-18
Citations
Metrics
Views
1844
since deposited on 2021-09-29
Acq. date: 2025-12-18
Citations