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Articles
Scalability of stress induced by contact-etch-stop layers: a simulation study
Publication:
Scalability of stress induced by contact-etch-stop layers: a simulation study
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Date
2007
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Eneman, Geert
;
Verheyen, Peter
;
De Keersgieter, An
;
Jurczak, Gosia
;
De Meyer, Kristin
Journal
IEEE Trans. Electron Devices
Abstract
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1913
since deposited on 2021-10-16
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Acq. date: 2025-12-16
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Metrics
Views
1913
since deposited on 2021-10-16
1
last month
Acq. date: 2025-12-16
Citations