Root cause of charge loss in nitride-based localized trapping memory cell

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Authors
Furnemont, Arnaud; Rosmeulen, Maarten; van der Zanden, Koen; Van Houdt, Jan; De Meyer, Kristin; Maes, Herman
Issue
6
Journal
IEEE Trans. Electron Devices
Volume
54
Title
Root cause of charge loss in nitride-based localized trapping memory cell
Publication type
Journal article
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