On the impact of metal impurities on the carrier lifetime in n-type germanium

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Authors
Gaubas, E.; Vanhellemont, J.; Simoen, Eddy; Theuwis, A.; Clauws, P.
Conference
Semiconductor Defect Engineering - Materials, Synthesis, Structures and Devices II
Title
On the impact of metal impurities on the carrier lifetime in n-type germanium
Publication type
Proceedings paper
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