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On the impact of metal impurities on the carrier lifetime in n-type germanium

dc.contributor.authorGaubas, E.
dc.contributor.authorVanhellemont, J.
dc.contributor.authorSimoen, Eddy
dc.contributor.authorTheuwis, A.
dc.contributor.authorClauws, P.
dc.date.accessioned2021-10-16T16:13:48Z
dc.date.available2021-10-16T16:13:48Z
dc.date.issued2007
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/12184
dc.sourceIIOimport
dc.titleOn the impact of metal impurities on the carrier lifetime in n-type germanium
dc.typeProceedings paper
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.source.peerreviewno
dc.source.beginpage0994-F09-06
dc.source.conferenceSemiconductor Defect Engineering - Materials, Synthesis, Structures and Devices II
dc.source.conferencedate9/04/2007
dc.source.conferencelocationSan Francisco, CA USA
imec.availabilityPublished - imec
imec.internalnotesMRS Symposium Proceedings; Vol. 994


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