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Effects of heavy-ion strikes on fully depleted SOI MOSFETs with ultra-thin gate oxide and different strain-inducing techniques
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Authors
Griffoni, A.
;
Gerardin, S.
;
Cester, A.
;
Paccagnella, A.
;
Simoen, Eddy
;
Claeys, Cor
Issue
6
Journal
IEEE Trans. Nuclear Science
Volume
54
Title
Effects of heavy-ion strikes on fully depleted SOI MOSFETs with ultra-thin gate oxide and different strain-inducing techniques
Publication type
Journal article
Embargo date
9999-12-31
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