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Extraction of the top and sidewall mobility in FinFETs and the impact of fin-patterning processes and gate dielectrics on mobility
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Authors
Iyengar, Vikram V.
;
Kottantharayil, Anil
;
Tranjan, Farid M.
;
Jurczak, Gosia
;
De Meyer, Kristin
Issue
5
Journal
IEEE Trans. Electron Devices
Volume
54
Title
Extraction of the top and sidewall mobility in FinFETs and the impact of fin-patterning processes and gate dielectrics on mobility
Publication type
Journal article
Embargo date
9999-12-31
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