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Proof-of-concept structure for investigation of successive soft gate oxide breakdowns in two dimensions

dc.contributor.authorKaczer, Ben
dc.contributor.authorFernandez, Raul
dc.contributor.authorNackaerts, Axel
dc.contributor.authorChiarella, Thomas
dc.contributor.authorGroeseneken, Guido
dc.date.accessioned2021-10-16T17:00:44Z
dc.date.available2021-10-16T17:00:44Z
dc.date.issued2007-07
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/12376
dc.sourceIIOimport
dc.titleProof-of-concept structure for investigation of successive soft gate oxide breakdowns in two dimensions
dc.typeProceedings paper
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorChiarella, Thomas
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecChiarella, Thomas::0000-0002-6155-9030
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage87
dc.source.endpage90
dc.source.conference14th International Symposium on the Physical and Failure Analysis of Integrated Circuits - IPFA
dc.source.conferencedate11/07/2007
dc.source.conferencelocationBangalore India
imec.availabilityPublished - open access


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