Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Conference contributions
Automated quantification of dimensions on tomographic reconstructions of semiconductor devices
Publication:
Automated quantification of dimensions on tomographic reconstructions of semiconductor devices
Copy permalink
Date
2007
Proceedings Paper
Simple item page
Full metadata
Statistics
Loading...
Loading...
Files
14207.pdf
777.32 KB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Kalio, Andre
;
Richard, Olivier
;
Sourty, Erwan
;
Bender, Hugo
Journal
Abstract
Description
Metrics
Views
1895
since deposited on 2021-10-16
Acq. date: 2025-12-17
Citations
Metrics
Views
1895
since deposited on 2021-10-16
Acq. date: 2025-12-17
Citations