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Characterization of post-etch photoresists used in metal hardmask and photoresist mask patterning schemes
Publication:
Characterization of post-etch photoresists used in metal hardmask and photoresist mask patterning schemes
Date
2007
Presentation
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Kesters, Els
;
Claes, Martine
;
Lux, Marcel
;
Le, Quoc Toan
;
Vereecke, Guy
;
Franquet, Alexis
;
Conard, Thierry
;
Mertens, Paul
;
Adriaensens, Peter
;
Carleer, Robert
;
Biebuyck, J.J.
;
Van Veltem, P.
;
Bebelman, Sabine
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Abstract
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2048
since deposited on 2021-10-16
Acq. date: 2025-10-25
Citations
Metrics
Views
2048
since deposited on 2021-10-16
Acq. date: 2025-10-25
Citations