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Transient and end silicide phase formation in thin film Ni/polycrystalline-Si reactions for fully-silicided gate applications
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Transient and end silicide phase formation in thin film Ni/polycrystalline-Si reactions for fully-silicided gate applications
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Date
2007
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Kittl, Jorge
;
Pawlak, Malgorzata
;
Torregiani, Cristina
;
Lauwers, Anne
;
Demeurisse, Caroline
;
Vrancken, Christa
;
Absil, Philippe
;
Biesemans, Serge
;
Coia, Cedrik
;
Detavernier, Christophe
;
Jordan-Sweet, Jean
;
Lavoie, Christian
Journal
Applied Physics Letters
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1907
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Acq. date: 2025-12-12
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Views
1907
since deposited on 2021-10-16
1
last month
1
last week
Acq. date: 2025-12-12
Citations