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Behavior of the 1/f noise and electron mobility in 65 nm FD SOI nMOSFETs employing different tensile-strain-inducing techniques
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Authors
Lukyanchikova, N.
;
Garbar, N.
;
Kudina, V.
;
Smolanka, A.
;
Simoen, Eddy
;
Claeys, Cor
Conference
Noise and Fluctuations: 19th International Conference
Title
Behavior of the 1/f noise and electron mobility in 65 nm FD SOI nMOSFETs employing different tensile-strain-inducing techniques
Publication type
Proceedings paper
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