Study of time-dependent dielectric breakdown on gate oxide capacitors at high temperature
dc.contributor.author | Moonen, R. | |
dc.contributor.author | Vanmeerbeek, P. | |
dc.contributor.author | Lekens, Geert | |
dc.contributor.author | De Ceuninck, Ward | |
dc.contributor.author | Moens, P. | |
dc.contributor.author | Boutsen, J. | |
dc.date.accessioned | 2021-10-16T18:02:28Z | |
dc.date.available | 2021-10-16T18:02:28Z | |
dc.date.issued | 2007 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/12593 | |
dc.source | IIOimport | |
dc.title | Study of time-dependent dielectric breakdown on gate oxide capacitors at high temperature | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Lekens, Geert | |
dc.contributor.imecauthor | De Ceuninck, Ward | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.beginpage | 288 | |
dc.source.endpage | 291 | |
dc.source.conference | 14th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits - IPFA | |
dc.source.conferencedate | 11/07/2007 | |
dc.source.conferencelocation | Bangalore India | |
imec.availability | Published - open access |