Publication:
In-line characterization of heterojunction bipolar transistor base layers by high-resolution X-ray diffraction
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1923 since deposited on 2021-10-16
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Acq. date: 2026-02-25
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Statistics
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1923 since deposited on 2021-10-16
1last month
1last week
Acq. date: 2026-02-25
Citations