Authors

Nguyen, Duy; Loo, Roger; Hikavyy, Andriy; Van Daele, Benny; Ryan, Paul; Wormington, Paul; Hopkins, John

Conference

3rd International Workshop on New Group IV Semiconductor Nanoelectronics

Title

In-line characterization of heterojunction bipolar transistor base layers by high-resolution x-ray diffraction

Publication type

Oral presentation