dc.contributor.author | Op de Beeck, Maaike | |
dc.contributor.author | Versluijs, Janko | |
dc.contributor.author | Tokei, Zsolt | |
dc.contributor.author | Demuynck, Steven | |
dc.contributor.author | de Marneffe, Jean-Francois | |
dc.contributor.author | Boullart, Werner | |
dc.contributor.author | Vanhaelemeersch, Serge | |
dc.contributor.author | Zhu, Helen | |
dc.contributor.author | Cirigliano, Peter | |
dc.contributor.author | Pavel, Elisabeth | |
dc.contributor.author | Sadjadi, Reza | |
dc.contributor.author | Kim, Jisoo | |
dc.date.accessioned | 2021-10-16T18:19:23Z | |
dc.date.available | 2021-10-16T18:19:23Z | |
dc.date.issued | 2007 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/12646 | |
dc.source | IIOimport | |
dc.title | A novel plasma-assisted shrink process to enlarge process windows of narrow trenches and contacts for 45-nm node applications and beyond | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Op de Beeck, Maaike | |
dc.contributor.imecauthor | Versluijs, Janko | |
dc.contributor.imecauthor | Tokei, Zsolt | |
dc.contributor.imecauthor | Demuynck, Steven | |
dc.contributor.imecauthor | de Marneffe, Jean-Francois | |
dc.contributor.imecauthor | Boullart, Werner | |
dc.contributor.imecauthor | Vanhaelemeersch, Serge | |
dc.contributor.orcidimec | Op de Beeck, Maaike::0000-0002-2700-6432 | |
dc.contributor.orcidimec | Boullart, Werner::0000-0001-7614-2097 | |
dc.contributor.orcidimec | Vanhaelemeersch, Serge::0000-0003-2102-7395 | |
dc.source.peerreview | no | |
dc.source.beginpage | 65190U | |
dc.source.conference | Advances in Resist Materials and Processing Technology XXIV | |
dc.source.conferencedate | 25/02/2007 | |
dc.source.conferencelocation | San Jose, CA USA | |
imec.availability | Published - imec | |
imec.internalnotes | SPIE Proceedings; Vol. 6519 | |