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In-situ curvature and diffraction measurements on thin-film Ni/Ge(100) and Ni/Ge(111) solid state reactions
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Authors
Opsomer, Karl
;
Deduytsche, D.
;
Detavernier, C.
;
Lavoie, C.
;
Lauwers, Anne
;
Van Meirhaeghe, R.L.
;
Maex, Karen
Conference
Materials for Advanced Metallization. Abstracts Book
Title
In-situ curvature and diffraction measurements on thin-film Ni/Ge(100) and Ni/Ge(111) solid state reactions
Publication type
Meeting abstract
Embargo date
9999-12-31
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