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In-situ curvature and diffraction measurements on thin-film Ni/Ge(100) and Ni/Ge(111) solid state reactions

dc.contributor.authorOpsomer, Karl
dc.contributor.authorDeduytsche, D.
dc.contributor.authorDetavernier, C.
dc.contributor.authorLavoie, C.
dc.contributor.authorLauwers, Anne
dc.contributor.authorVan Meirhaeghe, R.L.
dc.contributor.authorMaex, Karen
dc.date.accessioned2021-10-16T18:21:14Z
dc.date.available2021-10-16T18:21:14Z
dc.date.issued2007
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/12652
dc.sourceIIOimport
dc.titleIn-situ curvature and diffraction measurements on thin-film Ni/Ge(100) and Ni/Ge(111) solid state reactions
dc.typeMeeting abstract
dc.contributor.imecauthorOpsomer, Karl
dc.contributor.imecauthorLauwers, Anne
dc.contributor.imecauthorMaex, Karen
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.conferenceMaterials for Advanced Metallization. Abstracts Book
dc.source.conferencedate4/03/2007
dc.source.conferencelocationBrugge Belgium
imec.availabilityPublished - open access


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