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Electron mobility calculations for Si, Ge and III-V inversion layers with HfO2
Publication:
Electron mobility calculations for Si, Ge and III-V inversion layers with HfO2
Date
2007
Presentation
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
O'Regan, Terrance
;
Fischetti, Massimo
;
Soree, Bart
;
Magnus, Wim
Journal
Abstract
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1940
since deposited on 2021-10-16
445
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations
Metrics
Views
1940
since deposited on 2021-10-16
445
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations