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Reliability issues in deep deep sub-micron technologies: time-dependent variability and its impact on embedded system design

dc.contributor.authorPapanikolaou, Antonis
dc.contributor.authorWang, Hua
dc.contributor.authorMiranda Corbalan, Miguel
dc.contributor.authorCatthoor, Francky
dc.date.accessioned2021-10-16T18:27:59Z
dc.date.available2021-10-16T18:27:59Z
dc.date.issued2007-07
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/12673
dc.sourceIIOimport
dc.titleReliability issues in deep deep sub-micron technologies: time-dependent variability and its impact on embedded system design
dc.typeProceedings paper
dc.contributor.imecauthorCatthoor, Francky
dc.contributor.orcidimecCatthoor, Francky::0000-0002-3599-8515
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage121
dc.source.endpage121
dc.source.conferenceProceedings of the 13th IEEE International On-Line Testing Symposium
dc.source.conferencedate7/07/2007
dc.source.conferencelocationHeraklion Greece
imec.availabilityPublished - open access


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