Electrical stress on irradiated thin gate oxide partially depleted SOI nMOSFETs

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Authors

Rafi, J.M.; Simoen, Eddy; Mercha, Abdelkarim; Hayama, K.; Campabadal, F.; Ohyama, H.; Claeys, Cor

Issue

9_10

Journal

Microelectronic Engineering

Volume

84

Title

Electrical stress on irradiated thin gate oxide partially depleted SOI nMOSFETs

Publication type

Journal article

Embargo date

9999-12-31

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