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Fast and Accurate On-Wafer Extraction of Parasitic Resistances in GaAs MESFET's

dc.contributor.authorDebie, Peter
dc.contributor.authorMartens, Luc
dc.contributor.authorDe Zutter, Daniel
dc.date.accessioned2021-09-29T12:40:47Z
dc.date.available2021-09-29T12:40:47Z
dc.date.issued1994
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/127
dc.sourceIIOimport
dc.titleFast and Accurate On-Wafer Extraction of Parasitic Resistances in GaAs MESFET's
dc.typeProceedings paper
dc.contributor.imecauthorMartens, Luc
dc.contributor.imecauthorDe Zutter, Daniel
dc.source.peerreviewno
dc.source.beginpage7
dc.source.endpage11
dc.source.conferenceProceedings IEEE 1994 International Conference on Microelectronic Test Structures
imec.availabilityPublished - imec


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