Fast and Accurate On-Wafer Extraction of Parasitic Resistances in GaAs MESFET's
dc.contributor.author | Debie, Peter | |
dc.contributor.author | Martens, Luc | |
dc.contributor.author | De Zutter, Daniel | |
dc.date.accessioned | 2021-09-29T12:40:47Z | |
dc.date.available | 2021-09-29T12:40:47Z | |
dc.date.issued | 1994 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/127 | |
dc.source | IIOimport | |
dc.title | Fast and Accurate On-Wafer Extraction of Parasitic Resistances in GaAs MESFET's | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Martens, Luc | |
dc.contributor.imecauthor | De Zutter, Daniel | |
dc.source.peerreview | no | |
dc.source.beginpage | 7 | |
dc.source.endpage | 11 | |
dc.source.conference | Proceedings IEEE 1994 International Conference on Microelectronic Test Structures | |
imec.availability | Published - imec |
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