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Impact of the hard breakdown detection method on the extraction of the Wearout distribution parameters

dc.contributor.authorSahhaf, Sahar
dc.contributor.authorDegraeve, Robin
dc.contributor.authorRoussel, Philippe
dc.contributor.authorKaczer, Ben
dc.contributor.authorKauerauf, Thomas
dc.contributor.authorGroeseneken, Guido
dc.date.accessioned2021-10-16T19:20:25Z
dc.date.available2021-10-16T19:20:25Z
dc.date.issued2007
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/12832
dc.sourceIIOimport
dc.titleImpact of the hard breakdown detection method on the extraction of the Wearout distribution parameters
dc.typeOral presentation
dc.contributor.imecauthorSahhaf, Sahar
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.imecauthorRoussel, Philippe
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecRoussel, Philippe::0000-0002-0402-8225
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.conference38th IEEE Semiconductor Interfaces Specialists Conference
dc.source.conferencedate6/12/2007
dc.source.conferencelocationWashington, DC USA
imec.availabilityPublished - open access


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