Charge pumping and mobility measurements on strained SOI MOSFETs

Schmidt, M.; Gottlob, H. D. B.; Echermeyer, T.; Wahlbrink, T.; Mollenhauer, T.; Baus, M.; Buca, D.M.; Mantl, S.; Reiche, M.; Loo, Roger; Lemme, M.C.; Kurz, H.

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Charge pumping and mobility measurements on strained SOI MOSFETs

Date

2007

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1 since deposited on 2021-10-16

Acq. date: 2026-03-17

1962 since deposited on 2021-10-16

Acq. date: 2026-03-17

Charge pumping and mobility measurements on strained SOI MOSFETs

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