Charge pumping and mobility measurements on strained SOI MOSFETs

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Authors
Schmidt, M.; Gottlob, H. D. B.; Echermeyer, T.; Wahlbrink, T.; Mollenhauer, T.; Baus, M.; Buca, D.M.; Mantl, S.; Reiche, M.; Loo, Roger; Lemme, M.C.; Kurz, H.
Conference
8th European Workshop on ULtimate Integration of Silicon - ULIS
Title
Charge pumping and mobility measurements on strained SOI MOSFETs
Publication type
Proceedings paper
Embargo date
9999-12-31
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