Charge pumping and mobility measurements on strained SOI MOSFETs

Schmidt, M.; Gottlob, H. D. B.; Echermeyer, T.; Wahlbrink, T.; Mollenhauer, T.; Baus, M.; Buca, D.M.; Mantl, S.; Reiche, M.; Loo, Roger; Lemme, M.C.; Kurz, H.

Publication:

Charge pumping and mobility measurements on strained SOI MOSFETs

Date

2007

Proceedings Paper

Simple item page Full metadata Statistics

Files

15676.pdf 247.02 KB

Author(s)

;

;

;

;

;

;

;

;

;

;

;

Statistics

1 since deposited on 2021-10-16

Acq. date: 2026-02-25

1962 since deposited on 2021-10-16

Acq. date: 2026-02-25

Charge pumping and mobility measurements on strained SOI MOSFETs

Date

Files

Author(s)

Journal

Abstract

Description

Statistics

Downloads

Views

Citations

Statistics

Downloads

Views

Citations