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Faster ESD device characterization with wafer-level HBM

dc.contributor.authorScholz, Mirko
dc.contributor.authorTremouilles, David
dc.contributor.authorLinten, Dimitri
dc.contributor.authorRolain, Yves
dc.contributor.authorPintelon, Rik
dc.contributor.authorSawada, Masanori
dc.contributor.authorNakaei, Takumi
dc.contributor.authorHasebe, T.
dc.contributor.authorGroeseneken, Guido
dc.date.accessioned2021-10-16T19:29:27Z
dc.date.available2021-10-16T19:29:27Z
dc.date.issued2007
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/12858
dc.sourceIIOimport
dc.titleFaster ESD device characterization with wafer-level HBM
dc.typeProceedings paper
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.source.peerreviewno
dc.source.beginpage93
dc.source.endpage96
dc.source.conference20th IEEE International Conference on Microelectronic Test Structures - ICMTS
dc.source.conferencedate19/03/2007
dc.source.conferencelocationTokyo Japan
imec.availabilityPublished - imec


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