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Post-etch cleaning after dry etching the emitter windows to improve the bipolar characteristics in a 0.5 µm BiCMOS technology
Publication:
Post-etch cleaning after dry etching the emitter windows to improve the bipolar characteristics in a 0.5 µm BiCMOS technology
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Date
1994
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Decoutere, Stefaan
;
Vanhaelemeersch, Serge
;
Deferm, Ludo
;
Vleugels, Frank
;
Vancuyck, Geert
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Acq. date: 2025-12-23
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2051
since deposited on 2021-09-29
1
last month
1
last week
Acq. date: 2025-12-23
Citations