The length-dependence of the 1/f noise of graded-channel SOI nMOSFETs

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Authors
Simoen, Eddy; Claeys, Cor; Chung, T.M.; Flandre, D.; Raskin, J.P.
Conference
Microelectonics Technology and Devices SBMICRO 2007
Title
The length-dependence of the 1/f noise of graded-channel SOI nMOSFETs
Publication type
Proceedings paper
Embargo date
9999-12-31
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