The low-frequency noise behavior of pMOSFETs with embedded SiGe source/drain regions

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Authors
Simoen, Eddy; Verheyen, Peter; Loo, Roger; Claeys, Cor
Conference
Noise and Fluctuations. 19th International Conference
Title
The low-frequency noise behavior of pMOSFETs with embedded SiGe source/drain regions
Publication type
Proceedings paper
Embargo date
9999-12-31
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