Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Conference contributions
The critical role of the metal / porous low-k interface in post direct CMP defectivity generation and resulting ULK surface and bulk hydrophilisation
Publication:
The critical role of the metal / porous low-k interface in post direct CMP defectivity generation and resulting ULK surface and bulk hydrophilisation
Copy permalink
Date
2007
Proceedings Paper
Simple item page
Full metadata
Statistics
Loading...
Loading...
Files
16214.pdf
237.73 KB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Travaly, Youssef
;
Sinapi, Fabrice
;
Heylen, Nancy
;
Humbert, Aurelie
;
Delande, Tinne
;
Caluwaerts, Rudy
;
Gueneau de Mussy, Jean Paul
;
Vereecke, Guy
;
Baklanov, Mikhaïl
;
Iacopi, Francesca
;
Hernandez, Jose Luis
;
Beyer, Gerald
;
Fischer, Pamela
Journal
Abstract
Description
Metrics
Views
1923
since deposited on 2021-10-16
1
last month
Acq. date: 2025-12-13
Citations
Metrics
Views
1923
since deposited on 2021-10-16
1
last month
Acq. date: 2025-12-13
Citations