Publication:
Defect characterization of polycrystalline silicon layers obtained by aluminum-induced crystallization and epitaxy
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1925 since deposited on 2021-10-16
1last month
Acq. date: 2026-07-27
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Statistics
Views
1925 since deposited on 2021-10-16
1last month
Acq. date: 2026-07-27
Citations