dc.contributor.author | Degraeve, Robin | |
dc.contributor.author | De Wolf, Ingrid | |
dc.contributor.author | Groeseneken, Guido | |
dc.contributor.author | Maes, Herman | |
dc.date.accessioned | 2021-09-29T12:40:50Z | |
dc.date.available | 2021-09-29T12:40:50Z | |
dc.date.issued | 1994 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/130 | |
dc.source | IIOimport | |
dc.title | Analysis of Externally Imposed Mechanical Stress Effects on the Hot-Carrier-Induced Degradation of MOSFETs | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Degraeve, Robin | |
dc.contributor.imecauthor | De Wolf, Ingrid | |
dc.contributor.imecauthor | Groeseneken, Guido | |
dc.source.peerreview | no | |
dc.source.beginpage | 29 | |
dc.source.endpage | 33 | |
dc.source.conference | Proceedings International Reliability Physics Symposium - IRPS | |
dc.source.conferencedate | 11/04/1994 | |
dc.source.conferencelocation | San Jose, CA USA | |
imec.availability | Published - imec | |