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Analysis of Externally Imposed Mechanical Stress Effects on the Hot-Carrier-Induced Degradation of MOSFETs
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Authors
Degraeve, Robin
;
De Wolf, Ingrid
;
Groeseneken, Guido
;
Maes, Herman
Conference
Proceedings International Reliability Physics Symposium - IRPS
Title
Analysis of Externally Imposed Mechanical Stress Effects on the Hot-Carrier-Induced Degradation of MOSFETs
Publication type
Proceedings paper
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