Publication:

Analysis of Externally Imposed Mechanical Stress Effects on the Hot-Carrier-Induced Degradation of MOSFETs

Date

1994

Proceedings Paper

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Author(s)

Degraeve, Robin

;

De Wolf, Ingrid

;

Groeseneken, Guido

;

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1938 since deposited on 2021-09-29

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Acq. date: 2026-04-06