Publication:
Analysis of Externally Imposed Mechanical Stress Effects on the Hot-Carrier-Induced Degradation of MOSFETs
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1938 since deposited on 2021-09-29
Acq. date: 2026-05-16
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Statistics
Views
1938 since deposited on 2021-09-29
Acq. date: 2026-05-16
Citations