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Analysis of Externally Imposed Mechanical Stress Effects on the Hot-Carrier-Induced Degradation of MOSFETs

Date

1994
Proceedings Paper
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dc.contributor.authorDegraeve, Robin
dc.contributor.authorDe Wolf, Ingrid
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorMaes, Herman
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.imecauthorDe Wolf, Ingrid
dc.contributor.imecauthorGroeseneken, Guido
dc.date.accessioned2021-09-29T12:40:50Z
dc.date.available2021-09-29T12:40:50Z
dc.date.issued1994
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/130
dc.source.beginpage29
dc.source.conferenceProceedings International Reliability Physics Symposium - IRPS
dc.source.conferencedate11/04/1994
dc.source.conferencelocationSan Jose, CA USA
dc.source.endpage33
dc.title

Analysis of Externally Imposed Mechanical Stress Effects on the Hot-Carrier-Induced Degradation of MOSFETs

dc.typeProceedings paper
dspace.entity.typePublication
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