Voltage overshoot study in 20V DeMOS-SCR devices
dc.contributor.author | Vashchenko, Vladislav | |
dc.contributor.author | Jansen, Philippe | |
dc.contributor.author | Scholz, Mirko | |
dc.contributor.author | Hopper, Peter | |
dc.contributor.author | Sawada, Masanori | |
dc.contributor.author | Nakaei, Toshiyuki | |
dc.contributor.author | Hasebe, Takumi | |
dc.contributor.author | Thijs, Steven | |
dc.date.accessioned | 2021-10-16T21:12:31Z | |
dc.date.available | 2021-10-16T21:12:31Z | |
dc.date.issued | 2007-09 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/13146 | |
dc.source | IIOimport | |
dc.title | Voltage overshoot study in 20V DeMOS-SCR devices | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Thijs, Steven | |
dc.contributor.orcidimec | Thijs, Steven::0000-0003-2889-8345 | |
dc.source.peerreview | no | |
dc.source.beginpage | 53 | |
dc.source.endpage | 57 | |
dc.source.conference | EOS/ESD Symposium Proceedings | |
dc.source.conferencedate | 16/09/2007 | |
dc.source.conferencelocation | Anaheim, CA USA | |
imec.availability | Published - imec |
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