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Threshold voltage instability of p-channel metal-oxide-semiconductor field effect transistors with hafnium based dielectrics
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Authors
Zhao, C.Z.
;
Zahid, M.B.
;
Zhang, J.F.
;
Groeseneken, Guido
;
Degraeve, Robin
;
De Gendt, Stefan
Issue
14
Journal
Applied Physics Letters
Volume
90
Title
Threshold voltage instability of p-channel metal-oxide-semiconductor field effect transistors with hafnium based dielectrics
Publication type
Journal article
Embargo date
9999-12-31
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