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Properties of ALD HfTaxOy high-k layers deposited on chemical silicon oxide
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Properties of ALD HfTaxOy high-k layers deposited on chemical silicon oxide
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Date
2007
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Zhao, Chao
;
Witters, Thomas
;
Breimer, P.
;
Maes, Jan
;
Caymax, Matty
;
De Gendt, Stefan
Journal
Microelectronic Engineering
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1912
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Acq. date: 2026-01-07
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Views
1912
since deposited on 2021-10-16
1
last month
1
last week
Acq. date: 2026-01-07
Citations