Nanoscale effects of annealing on the electrical characteristic of hafnium based devices measured in a vacuum environment
dc.contributor.author | Aguilera, Lidia | |
dc.contributor.author | Polspoel, Wouter | |
dc.contributor.author | Porti, Marc | |
dc.contributor.author | Vandervorst, Wilfried | |
dc.contributor.author | Nafria, Montserrat | |
dc.contributor.author | Aymerich, Xavier | |
dc.date.accessioned | 2021-10-17T06:13:31Z | |
dc.date.available | 2021-10-17T06:13:31Z | |
dc.date.issued | 2008 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/13294 | |
dc.source | IIOimport | |
dc.title | Nanoscale effects of annealing on the electrical characteristic of hafnium based devices measured in a vacuum environment | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Vandervorst, Wilfried | |
dc.source.peerreview | no | |
dc.source.beginpage | 657 | |
dc.source.endpage | 658 | |
dc.source.conference | IEEE International Reliability Physics Symposium Proceedings - IRPS | |
dc.source.conferencedate | 27/04/2008 | |
dc.source.conferencelocation | Phoenix, AZ USA | |
imec.availability | Published - imec |
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